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ES 40C1 ELECTRON SOURCE

DESCRIPTION

The ES 40C1 Electron Source is a scanable electron gun with small spot profile. Due to the high transmission of its Einzel-Lens, the ES 40C delivers a high electron beam current over a wide energy range. The ES 40C1 is designed for a stable and reliable operation in e.g. AES, scanning applications, imaging, EELS and electron pulse or desorption experiments (ESD).

FEATURES

  • Fine focus microformed tip cathode
  • Scannable electron source with a small spot profile
  • Integrated scan and deflection unit
  • Correction of incident electron beam angle (provided by ES40-PS power supply)

 

OPTIONS

  • Linear shift
  • Customised insertion length
  • Source shielding material (µ-metal or copper)

TECHNICAL DATA

Mounting flange           DN 40 CF (rotatable)

Energy range               0 – 5 keV

Sample current            up to 100 µA

Scan area                   10 mm × 10 mm

Shield                        Cu or µ-metal

Cathode type              horiated tungsten

Insertion length             min. 155.7 mm, other on request
OD: 33.5 mm (µ-metal), 35 mm (Cu)

Beam diameter             dependent on working distance,

(FWHM)                       min. 120 µm (for distance 56 mm),

Working distance            23 mm – 150 mm (typical 75 mm)

Bakeout temperature       up to 250 °C

Working pressure            < 5×10-6 mbar

 

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